This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and tes...
An experiment has been designed to evaluate multiple testing techniques for combinational circuits. To perform the experiment, a 25k gate CMOS Test Chip has been designed, manufac...
Piero Franco, William D. Farwell, Robert L. Stokes...
A 25k gate Test Chip was designed and manufactured to evaluate different test methods for scan-designed circuits. The design of the chip, the experiment, and preliminary experimen...
Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin...
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu,...
The two most common strategies for verification and validation, inspection and testing, are in a controlled experiment evaluated in terms of their fault detection capabilities. Th...
Carina Andersson, Thomas Thelin, Per Runeson, Nina...