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DDECS
2007
IEEE
14 years 3 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
IPPS
2006
IEEE
14 years 3 months ago
2006
IEEE
Performance and workload modeling has numerous uses at every stage of the high-end computing lifecycle: design, integration, procurement, installation and tuning. Despite the trem...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Process variations due to lens aberrations are to a large extent systematic, and can be modeled for purposes of analyses and optimizations in the design phase. Traditionally, vari...
MICRO
2009
IEEE
14 years 3 months ago
2009
IEEE
Process variations in integrated circuits have significant impact on their performance, leakage and stability. This is particularly evident in large, regular and dense structures...
IFIP
2004
Springer
14 years 2 months ago
2004
Springer
Peer-to-peer systems, exchanging dynamic documents through Web services, are a simple and effective platform for data integration on the internet. Dynamic documents can contain b...