1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
Performance and workload modeling has numerous uses at every stage of the high-end computing lifecycle: design, integration, procurement, installation and tuning. Despite the trem...
Process variations due to lens aberrations are to a large extent systematic, and can be modeled for purposes of analyses and optimizations in the design phase. Traditionally, vari...
Andrew B. Kahng, Chul-Hong Park, Puneet Sharma, Qi...
Process variations in integrated circuits have significant impact on their performance, leakage and stability. This is particularly evident in large, regular and dense structures...
Peer-to-peer systems, exchanging dynamic documents through Web services, are a simple and effective platform for data integration on the internet. Dynamic documents can contain b...