1727 search results - page 27 / 346 » An Integrated Approach to Manufacturing Process Design and C... |
DATE
2003
IEEE
14 years 27 days ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
COOP
2004
13 years 9 months ago
2004
This paper proposes a method which assists the firms for cooperating in make-to-order production. We especially focus on the operational decision levels of manufacturing companies ...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper we present an approach to the design optimization of faulttolerant embedded systems for safety-critical applications. Processes are statically scheduled and communic...
MTDT
1999
IEEE
13 years 12 months ago
1999
IEEE
Continuing improvements in semiconductor fabrication density are enabling new classes of System-on-aChip architectures that combine extensive processing logic and high-density mem...
ETFA
2006
IEEE
14 years 1 months ago
2006
IEEE
In the present paper we propose a method that permits visualization of manufacturing devices from a functional perspective. The aim of this method is to raise raction level of man...