69 search results - page 8 / 14 » An event-guided approach to reducing voltage noise in proces... |
IOLTS
2006
IEEE
14 years 1 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
DAC
2006
ACM
13 years 11 months ago
2006
ACM
Security and reliability in processor based systems are concerns requiring adroit solutions. Security is often compromised by code injection attacks, jeopardizing even `trusted so...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
System optimization techniques based on dynamic voltage scaling (DVS) are widely used with the aim of reducing processor energy consumption. Inter-task DVS assigns the same voltag...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
We investigate an integrated approach to fault tolerance and dynamic power management in real-time embedded systems. Fault tolerance is achieved via checkpointing and power manage...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
This paper proposes a stochastic dynamic thermal management (DTM) technique in high-performance VLSI system with especial attention to the uncertainty in temperature observation. ...