117 search results - page 19 / 24 » An optimal algorithm for sizing sequential circuits for indu... |
TCAD
2010
13 years 2 months ago
2010
Starting from the 90nm technology node, process induced stress has played a key role in the design of highperformance devices. The emergence of source/drain silicon germanium (S/D ...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
GECCO
2008
Springer
13 years 8 months ago
2008
Springer
In this work we present a new methodology for structure and parameter estimation in cell systems biology modelling. Our modelling framework is based on P systems, an unconl comput...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
On-chip supply networks are playing an increasingly important role for modern nanometer-scale designs. However, the ever growing sizes of power grids make the analysis problem ext...