135 search results - page 4 / 27 » Analog circuit test based on a digital signature |
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
DATE
2010
IEEE
14 years 16 days ago
2010
IEEE
Abstract—This article discusses system-level techniques to optimize the power-performance trade-off in subthreshold circuits and presents a uniform platform for implementing ultr...
ET
2002
13 years 7 months ago
2002
Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is prop...
GLVLSI
2009
IEEE
14 years 2 months ago
2009
IEEE
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
— This paper presents a novel design of analog window comparator circuit. The comparator can adaptively adjust its error threshold according to the magnitude of input signal leve...