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» Analysis and Design of Active IC Metering Schemes
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DAC
2004
ACM
14 years 8 months ago
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
MVA
2000
234views Computer Vision» more  MVA 2000»
13 years 7 months ago
An automatic assessment scheme for steel quality inspection
This paper presents an automatic system for steel quality assessment, by measuring textural properties of carbide distributions. In current steel inspection, specially etched and p...
Klaus Wiltschi, Axel Pinz, Tony Lindeberg
ISCAS
2006
IEEE
88views Hardware» more  ISCAS 2006»
14 years 1 months ago
SiP integration of intelligent, adaptive, self-sustaining power management solutions for portable applications
Abstract—Power management is an essential component of any electrical system, and nowadays a limiting factor in the miniaturization of portable electronic devices. Not only are t...
E. O. Torres, Min Chen, H. Pooya Forghani-zadeh, V...
HPCA
2005
IEEE
14 years 7 months ago
Voltage and Frequency Control With Adaptive Reaction Time in Multiple-Clock-Domain Processors
Dynamic voltage and frequency scaling (DVFS) is a widely-used method for energy-efficient computing. In this paper, we present a new intra-task online DVFS scheme for multiple clo...
Qiang Wu, Philo Juang, Margaret Martonosi, Douglas...
DAC
2003
ACM
14 years 20 days ago
Low-power design methodology for an on-chip bus with adaptive bandwidth capability
This paper describes a low-power design methodology for a bus architecture based on hybrid current/voltage mode signaling for deep sub-micrometer on-chip interconnects that achiev...
Rizwan Bashirullah, Wentai Liu, Ralph K. Cavin III