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ICCD
2008
IEEE
165views Hardware» more  ICCD 2008»
14 years 4 months ago
Analysis and minimization of practical energy in 45nm subthreshold logic circuits
Abstract— Over the last decade, the design of ultra-lowpower digital circuits in subthreshold regime has been driven by the quest for minimum energy per operation. In this contri...
David Bol, Renaud Ambroise, Denis Flandre, Jean-Di...
DAC
2009
ACM
14 years 9 months ago
Analysis and mitigation of process variation impacts on Power-Attack Tolerance
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
Lang Lin, Wayne P. Burleson
ICCAD
2009
IEEE
121views Hardware» more  ICCAD 2009»
13 years 5 months ago
MOLES: Malicious off-chip leakage enabled by side-channels
Economic incentives have driven the semiconductor industry to separate design from fabrication in recent years. This trend leads to potential vulnerabilities from untrusted circui...
Lang Lin, Wayne Burleson, Christof Paar
DAC
2008
ACM
14 years 8 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
ICCAD
2009
IEEE
161views Hardware» more  ICCAD 2009»
13 years 5 months ago
The epsilon-approximation to discrete VT assignment for leakage power minimization
As VLSI technology reaches 45nm technology node, leakage power optimization has become a major design challenge. Threshold voltage (vt) assignment has been extensively studied, du...
Yujia Feng, Shiyan Hu