1398 search results - page 100 / 280 » Application-Specific Integrated Circuits |
ISVLSI
2008
IEEE
14 years 2 months ago
2008
IEEE
As integrated circuits are scaled down it becomes difficult to maintain uniformity in process parameters across each individual die. The resulting performance variation requires ...
ISQED
2007
IEEE
14 years 2 months ago
2007
IEEE
Parameter variation in integrated circuits causes sections of a chip to be slower than others. To prevent any resulting timing errors, designers have traditionally designed for th...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in futu...
GLVLSI
2005
IEEE
14 years 1 months ago
2005
IEEE
We develop a neural network that learns to separate the nominal from the faulty instances of a circuit in a measurement space. We demonstrate that the required separation boundari...
SBCCI
2005
ACM
14 years 1 months ago
2005
ACM
In this work the design of radiofrequency CMOS circuit blocks in the 910MHz ISM band, while biasing the MOS transistor in the moderate inversion region, is analyzed. An amplifier ...