We have developed two novel methods of fabricating very small Si single-electron transistors (SETs), called PAtternDependent OXidation (PADOX) and Vertical PAttern-Dependent OXida...
Concurrent error detection (CED) techniques (based on hardware duplication, parity codes, etc.) are widely used to enhance system dependability. All CED techniques introduce some ...
—Maze routing algorithms are widely used for finding an optimal path in detailed routing for very large scale integration, printed circuit board and multichip modules In this pap...
Configurable Computing Machines (CCMs) are an emerging class of computing platform which provide the computational performance benefits of ASICs, yet retain the flexibility and ra...
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...