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DAC
2008
ACM
13 years 10 months ago
Technology exploration for graphene nanoribbon FETs
Graphene nanoribbon FETs (GNRFETs) are promising devices for beyond-CMOS nanoelectronics because of their excellent carrier transport properties and potential for large scale proc...
Mihir R. Choudhury, Youngki Yoon, Jing Guo, Kartik...
ICCD
2004
IEEE
172views Hardware» more  ICCD 2004»
14 years 5 months ago
A Signal Integrity Test Bed for PCB Buses
Research in high-speed interconnect requires physical test to validate circuit models and design assumptions. At multi-Gbit/sec rates, physical implementations require custom circ...
Jihong Ren, Mark R. Greenstreet
CDES
2006
100views Hardware» more  CDES 2006»
13 years 9 months ago
Integrity and Integration Issues for Nano-Tube Based Interconnect Systems
: As we continue miniaturization of circuits into nano-scale, interconnects have been recognized as the limiting factor for next generation of computing structures. To increase the...
Tulin Mangir
ICCAD
2008
IEEE
107views Hardware» more  ICCAD 2008»
14 years 2 months ago
Importance sampled circuit learning ensembles for robust analog IC design
This paper presents ISCLEs, a novel and robust analog design method that promises to scale with Moore’s Law, by doing boosting-style importance sampling on digital-sized circuit...
Peng Gao, Trent McConaghy, Georges G. E. Gielen
ISQED
2006
IEEE
153views Hardware» more  ISQED 2006»
14 years 2 months ago
Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO)
Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...
Chong Zhao, Sujit Dey