14 search results - page 2 / 3 » Approach for physical design in sub-100 nm era |
DAC
2004
ACM
13 years 11 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
TVLSI
2010
13 years 2 months ago
2010
Dynamic gates have been excellent choice in the design of high-performance modules in modern microprocessors. The only limitation of dynamic gates is their relatively low noise mar...
GI
2009
Springer
14 years 1 days ago
2009
Springer
: Future nano scale devices will expose different characteristics than todays silicon devices. While the exponential growth of non recurring expenses (NRE, mostly due to mask sets)...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
eously demand shorter and less costly design cycles. Designing at higher levels of abstraction makes both objectives achievable, but enabling techniques like behavioral synthesis h...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...