Today's feature-rich multimedia products require embedded system solution with complex System-on-Chip (SoC) to meet market expectations of high performance at a low cost and l...
T. S. Rajesh Kumar, C. P. Ravikumar, R. Govindaraj...
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
The lack of memory safety in many popular programming languages, including C and C++, has been a cause for great concern in the realm of software reliability, verification, and mo...
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
The publish/subscribe communication paradigm is an appealing mechanism for efficient content retrieval due to the decoupling of data sources and consumers. However, the location d...