Sciweavers

4287 search results - page 799 / 858
» Assessing Architectural Complexity
Sort
View
DAC
2008
ACM
14 years 11 months ago
Specify-explore-refine (SER): from specification to implementation
Driven by increasing complexity and reliability demands, the Japanese Aerospace Exploration Agency (JAXA) in 2004 commissioned development of ELEGANT, a complete SpecC-based envir...
Andreas Gerstlauer, Junyu Peng, Dongwan Shin, Dani...
DAC
2007
ACM
14 years 11 months ago
An Effective Guidance Strategy for Abstraction-Guided Simulation
tive Guidance Strategy for Abstraction-Guided Simulation Flavio M. De Paula Alan J. Hu Department of Computer Science, University of British Columbia, {depaulfm, ajh}@cs.ubc.ca D...
Flavio M. de Paula, Alan J. Hu
DAC
2007
ACM
14 years 11 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2002
ACM
14 years 11 months ago
The next chip challenge: effective methods for viable mixed technology SoCs
The next generation of computer chips will continue the trend for more complexity than their predecessors. Many of them will contain different chip technologies and are termed SoC...
H. Bernhard Pogge
DAC
2003
ACM
14 years 11 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...