27 search results - page 4 / 6 » Asynchronous circuits transient faults sensitivity evaluatio... |
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...
CHES
2006
Springer
13 years 11 months ago
2006
Springer
This paper presents a Path Swapping (PS) method which enables to enhance the security of Quasi Delay Insensitive Asynchronous Circuits against Power Analysis (PA) attack. This appr...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...