1569 search results - page 275 / 314 » Automated Design Improvement by Example |
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Many embedded systems contain resource constrained microcontrollers where applications, operating system components and device drivers reside within a single address space with no...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
1999
ACM
14 years 8 months ago
1999
ACM
We empirically assess the implications of fixed terminals for hypergraph partitioning heuristics. Our experimental testbed incorporates a leading-edge multilevel hypergraph partit...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
We propose Satisfiability Checking (SAT) techniques that lead to a consistent performance improvement of up to 3x over state-ofthe-art SAT solvers like Chaff on important problem ...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
In this paper, we present a methodology for low-cost and rapid context switch for multithreaded embedded processors with realtime guarantees. Context-switch, which involves saving...