1414 search results - page 219 / 283 » Automated Metamorphic Testing |
DAC
2000
ACM
14 years 8 months ago
2000
ACM
We revisit a basic element of modern signal integrity analysis, the modeling of worst-case coupling capacitance effects within a switch factor (SF) based methodology. We show that...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...
DAC
2001
ACM
14 years 8 months ago
2001
ACM
Portable systems require long battery lifetime while still delivering high performance. Dynamic voltage scaling (DVS) algorithms reduce energy consumption by changing processor sp...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
Many real-time embedded systems involve a collection of independently executing event-driven code blocks, having hard real-time constraints. Tasks in many such systems, like netwo...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Chemical-mechanical planarization (CMP) and other manufacturing steps in very deep-submicron VLSI have varying effects on device and interconnect features, depending on the local ...