106 search results - page 15 / 22 » Automated Source-Level Error Localization in Hardware Design... |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Optical proximity correction (OPC) is one of the most widely used resolution enhancement techniques (RET) in nanometer designs to improve subwavelength printability. Conventional ...
ITNG
2008
IEEE
14 years 1 months ago
2008
IEEE
We propose the characteristics of a software tool that leverages specifying attack pattern details in understandable hierarchies. These hierarchies are currently manually populate...
FMICS
2009
Springer
14 years 2 months ago
2009
Springer
Cell libraries often contain a simulation model in a system design language, such as Verilog. These languages usually involve nondeterminism, which in turn, poses a challenge to th...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
Hardware accelerators are common in embedded systems that have high performance requirements but must still operate within stringent energy constraints. To facilitate short time-t...