90 search results - page 3 / 18 » Automatic generation of synthetic sequential benchmark circu... |
ISCAS
1999
IEEE
13 years 11 months ago
1999
IEEE
To provide a better understanding of physical design algorithms and the underlying circuit architecture they are targeting, we need to exercise the algorithms and architectures wi...
TSMC
2010
13 years 1 months ago
2010
Abstract--It is critical to use automated generators for synthetic models and data, given the sparsity of benchmark models for empirical analysis and the cost of generating models ...
ITC
1994
IEEE
13 years 10 months ago
1994
IEEE
AAAI
2008
13 years 9 months ago
2008
Automated generators for synthetic models and data can play a crucial role in designing new algorithms/modelframeworks, given the sparsity of benchmark models for empirical analys...
ICCAD
1998
IEEE
13 years 11 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...