90 search results - page 7 / 18 » Automatic generation of synthetic sequential benchmark circu... |
SDM
2008
SIAM
13 years 8 months ago
2008
SIAM
Sequential pattern mining first proposed by Agrawal and Srikant has received intensive research due to its wide range applicability in many real-life domains. Various improvements...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
DATE
2010
IEEE
14 years 2 days ago
2010
IEEE
—We present Huckleberry, a tool for automatically generating parallel implementations for multi-core platforms from sequential recursive divide-and-conquer programs. The recursiv...
VLSID
2007
IEEE
14 years 7 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
ISQED
2009
IEEE
14 years 1 months ago
2009
IEEE
Estimation of maximal power consumption is an essential task in VLSI circuit realizations since power value significantly affects the reliability of the circuits. The key issue o...