12745 search results - page 2349 / 2549 » Automating test automation |
143
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
It has been widely recognized that the dynamic range information of an application can be exploited to reduce the datapath bitwidth of either processors or ASICs, and therefore th...
142
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
119
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
Device optimization considering supply voltage Vdd and threshold voltage Vt tuning does not increase chip area but has a great impact on power and performance in the nanometer tec...
140
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
In this work, we propose a new paradigm called power emulation, which exploits hardware acceleration to drastically speedup power estimation. Power emulation is based on the obser...
129
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...