Sciweavers

233 search results - page 15 / 47
» Balance Testing of Logic Circuits
Sort
View
CHES
2005
Springer
100views Cryptology» more  CHES 2005»
14 years 1 months ago
Masked Dual-Rail Pre-charge Logic: DPA-Resistance Without Routing Constraints
During the last years, several logic styles that counteract side-channel attacks have been proposed. They all have in common that their level of resistance heavily depends on imple...
Thomas Popp, Stefan Mangard
ICCAD
1997
IEEE
108views Hardware» more  ICCAD 1997»
13 years 11 months ago
Fault simulation of interconnect opens in digital CMOS circuits
We describe a highly accurate but e cient fault simulator for interconnect opens, based on characterizing the standard cell library with SPICE; using transistor charge equations f...
Haluk Konuk
EVOW
2001
Springer
13 years 12 months ago
ARPIA: A High-Level Evolutionary Test Signal Generator
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
ITC
1998
IEEE
114views Hardware» more  ITC 1998»
13 years 11 months ago
BETSY: synthesizing circuits for a specified BIST environment
This paper presents a logic synthesis tool called BETSY (BIST Environment Testable Synthesis) for synthesizing circuits that achieve complete (100%)fault coverage in a user specif...
Zhe Zhao, Bahram Pouya, Nur A. Touba
ASPDAC
2004
ACM
85views Hardware» more  ASPDAC 2004»
13 years 11 months ago
Multi-level placement with circuit schema based clustering in analog IC layouts
This paper aims at developing an automated device-level placement for analog circuit design which achieves comparable quality to manual designs by experts. It extracts a set of cl...
Takashi Nojima, Xiaoke Zhu, Yasuhiro Takashima, Sh...