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MICRO
2007
IEEE
150views Hardware» more  MICRO 2007»
14 years 5 months ago
Leveraging 3D Technology for Improved Reliability
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...
Niti Madan, Rajeev Balasubramonian
ICCAD
2002
IEEE
161views Hardware» more  ICCAD 2002»
14 years 7 months ago
Non-tree routing for reliability and yield improvement
We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...
Andrew B. Kahng, Bao Liu, Ion I. Mandoiu
DSN
2008
IEEE
14 years 5 months ago
WS-DREAM: A distributed reliability assessment Mechanism for Web Services
It is critical to guarantee the reliability of serviceoriented applications. This is because they may employ remote Web Services as components, which may easily become unavailable...
Zibin Zheng, Michael R. Lyu
SIGSOFT
2007
ACM
14 years 11 months ago
A study of interleaving coverage criteria
Concurrency bugs are becoming increasingly important due to the prevalence of concurrent programs. A fundamental problem of concurrent program bug detection and testing is that th...
Shan Lu, Weihang Jiang, Yuanyuan Zhou
ICCD
2008
IEEE
157views Hardware» more  ICCD 2008»
14 years 8 months ago
Power-aware soft error hardening via selective voltage scaling
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
Kai-Chiang Wu, Diana Marculescu