1343 search results - page 39 / 269 » Bounded-lifetime integrated circuits |
129
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DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
— It has been the conventional assumption that, due to the superlinear dependence of leakage power consumption on temperature, and widely varying on-chip temperature profiles, a...
125
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ISQED
2005
IEEE
15 years 9 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
124
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
This paper describes a systematic approach that facilitates yield improvement of integrated circuits at the post-manufacture stage. A new Configurable Analogue Transistor (CAT) st...
124
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
This paper demonstrates a system that performs multiobjective sizing across 100,000 analog circuit topologies simultaneously, with SPICE accuracy. It builds on a previous system, ...
143
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DATE
2003
IEEE
15 years 9 months ago
2003
IEEE
† Noise performance is a critical analog and RF circuit design constraint, and can impact the selection of the IC system-level architecture. It is therefore imperative that some ...