1343 search results - page 39 / 269 » Bounded-lifetime integrated circuits |
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
— It has been the conventional assumption that, due to the superlinear dependence of leakage power consumption on temperature, and widely varying on-chip temperature profiles, a...
ISQED
2005
IEEE
14 years 2 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
This paper describes a systematic approach that facilitates yield improvement of integrated circuits at the post-manufacture stage. A new Configurable Analogue Transistor (CAT) st...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
This paper demonstrates a system that performs multiobjective sizing across 100,000 analog circuit topologies simultaneously, with SPICE accuracy. It builds on a previous system, ...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
† Noise performance is a critical analog and RF circuit design constraint, and can impact the selection of the IC system-level architecture. It is therefore imperative that some ...