1343 search results - page 62 / 269 » Bounded-lifetime integrated circuits |
169
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INTEGRATION
2006
15 years 4 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
125
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DATE
2002
IEEE
15 years 9 months ago
2002
IEEE
In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These set...
107
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VTS
2000
IEEE
15 years 8 months ago
2000
IEEE
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
147
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
Thermal problems and limitations on interlayer via densities are important design constraints on three-dimensional integrated circuits (3D ICs), and need to be considered during g...
122
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DAC
1999
ACM
15 years 8 months ago
1999
ACM
In this survey paper we describethe combination of: discretized integral formulations, sparsication techniques, and krylov-subspace based model-order reduction that has led to rob...