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ASPDAC
2009
ACM
137views Hardware» more  ASPDAC 2009»
13 years 11 months ago
Reconfigurable double gate carbon nanotube field effect transistor based nanoelectronic architecture
-- Carbon nanotubes (CNTs) and carbon nanotube field effect transistors (CNFETs) have demonstrated extraordinary properties and are widely accepted as the building blocks of next g...
Bao Liu
COMPSAC
2007
IEEE
14 years 1 months ago
Architecture-Based Software Reliability: Why Only a Few Parameters Matter?
Uncertainty analysis through sensitivity studies and quantification of the variance of the reliability estimate has become more common in architecture-based software reliability ...
Katerina Goseva-Popstojanova, Margaret Hamill
DAC
2010
ACM
13 years 11 months ago
LUT-based FPGA technology mapping for reliability
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...
Jason Cong, Kirill Minkovich
ITSSA
2006
76views more  ITSSA 2006»
13 years 7 months ago
Reliability Self-Assessment in Reactive Autonomic Systems: Autonomic System-Time Reactive Model Approach
Abstract: This paper targets the reactive autonomic system's self-monitoring of one of the most important nonfunctional properties, reliability. There are currently no adequat...
Olga Ormandjieva, Heng Kuang, Emil Vassev
DAC
2003
ACM
14 years 18 days ago
Performance trade-off analysis of analog circuits by normal-boundary intersection
We present a new technique to examine the trade-off regions of a circuit where its competing performances become “simultaneously optimal”, i.e. Pareto optimal. It is based on ...
Guido Stehr, Helmut E. Graeb, Kurt Antreich