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» Cell architecture for nanoelectronic design
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DAC
2006
ACM
14 years 8 months ago
Statistical logic cell delay analysis using a current-based model
A statistical model for the purpose of logic cell timing analysis in the presence of process variations is presented. A new current-based cell delay model is utilized, which can a...
Hanif Fatemi, Shahin Nazarian, Massoud Pedram
SIGCOMM
2010
ACM
13 years 7 months ago
Breathe to stay cool: adjusting cell sizes to reduce energy consumption
Reducing the energy consumption of a wireless cellular network is an important and urgent problem. This paper studies the effect of cell sizes on the energy consumed by the networ...
Sourjya Bhaumik, Girija J. Narlikar, Subhendu Chat...
DAC
2006
ACM
14 years 8 months ago
Standard cell characterization considering lithography induced variations
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
Ke Cao, Sorin Dobre, Jiang Hu
DAC
2008
ACM
13 years 9 months ago
IntellBatt: towards smarter battery design
Battery lifetime and safety are primary concerns in the design of battery operated systems. Lifetime management is typically supervised by the system via battery-aware task schedu...
Suman Kalyan Mandal, Praveen Bhojwani, Saraju P. M...
VLSID
2004
IEEE
139views VLSI» more  VLSID 2004»
14 years 8 months ago
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
André Ivanov, Baosheng Wang, Josh Yang