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TVLSI
2008
151views more  TVLSI 2008»
13 years 10 months ago
Guest Editorial Special Section on Design Verification and Validation
ion levels. The framework also supports the generation of test constraints, which can be satisfied using a constraint solver to generate tests. A compositional verification approac...
I. Harris, D. Pradhan
DAC
2008
ACM
14 years 12 months ago
The synthesis of robust polynomial arithmetic with stochastic logic
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...
Weikang Qian, Marc D. Riedel
TC
1998
13 years 10 months ago
Abstraction Techniques for Validation Coverage Analysis and Test Generation
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
DATE
2000
IEEE
136views Hardware» more  DATE 2000»
14 years 3 months ago
On Applying Incremental Satisfiability to Delay Fault Testing
The Boolean satisfiability problem (SAT) has various applications in electronic design automation (EDA) fields such as testing, timing analysis and logic verification. SAT has bee...
Joonyoung Kim, Jesse Whittemore, Karem A. Sakallah...