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DAC
2001
ACM
16 years 7 months ago
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
Li Chen, Xiaoliang Bai, Sujit Dey
DAC
2003
ACM
16 years 7 months ago
Implications of technology scaling on leakage reduction techniques
The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limit...
Yuh-Fang Tsai, David Duarte, Narayanan Vijaykrishn...
DAC
2003
ACM
16 years 7 months ago
An adaptive window-based susceptance extraction and its efficient implementation
The determination of the set (or window) of segments that are inductively coupled to a significant degree with a given segment plays a fundamental role in window-based techniques ...
Guoan Zhong, Cheng-Kok Koh, Venkataramanan Balakri...
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DAC
2004
ACM
16 years 7 months ago
Automated design of operational transconductance amplifiers using reversed geometric programming
We present a method for designing operational amplifiers using reversed geometric programming, which is an extension of geometric programming that allows both convex and non-conve...
Johan P. Vanderhaegen, Robert W. Brodersen
DAC
2005
ACM
16 years 7 months ago
IODINE: a tool to automatically infer dynamic invariants for hardware designs
We describe IODINE, a tool to automatically extract likely design properties using dynamic analysis. A practical bottleneck in the formal verification of hardware designs is the n...
Sudheendra Hangal, Naveen Chandra, Sridhar Narayan...