1327 search results - page 54 / 266 » Citing for high impact |
HPCA
2008
IEEE
14 years 4 months ago
2008
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...
VLSID
2002
IEEE
14 years 10 months ago
2002
IEEE
Abstract - The deep sub-micron regime has broughtup several manufacturing issues which impact circuit-performance and design. One such issue is flaring of transistors which causes ...
GEOINFORMATICA
2007
13 years 10 months ago
2007
Orthophotos (or orthoimages if in digital form) have long been recognised as a supplement or alternative to standard maps. The increasing applications of orthoimages require effor...
ITC
1998
IEEE
14 years 2 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
GLOBE
2010
Springer
13 years 10 months ago
2010
Springer
Abstract. As data volumes processed by large-scale distributed dataintensive applications grow at high-speed, an increasing I/O pressure is put on the underlying storage service, w...