1108 search results - page 7 / 222 » Clustered Level Planarity |
ISMAR
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper proposes a method to automatically detect and reconstruct planar surfaces for immediate use in AR tasks. Traditional methods for plane detection are typically based on ...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
The fraction of ICs that pass all production tests but fail in the application is called the defect level. Defect levels depend on the average number of defects per IC, and also o...
DAC
2001
ACM
14 years 8 months ago
2001
ACM
In this paper, we study the problem of performance-driven multi-level circuit clustering with application to hierarchical FPGA designs. We first show that the performance-driven m...
MSS
2003
IEEE
14 years 23 days ago
2003
IEEE
When data resides on tertiary storage, clustering is the key to achieving high retrieval performance. However, a straightforward approach to clustering massive amounts of data on ...
ECCV
2006
Springer
14 years 9 months ago
2006
Springer
Occlusion and lack of visibility in dense crowded scenes make it very difficult to track individual people correctly and consistently. This problem is particularly hard to tackle i...