62 search results - page 7 / 13 » Concurrent Fault Detection in Random Combinational Logic |
VTS
2006
IEEE
14 years 21 days ago
2006
IEEE
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
ICRA
2007
IEEE
14 years 1 months ago
2007
IEEE
— This paper presents a sensor analysis based fault detection approach (which we call SAFDetection) that is used to monitor tightly-coupled multi-robot team tasks. Our approach a...
VTS
2005
IEEE
14 years 8 days ago
2005
IEEE
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
ATS
2000
IEEE
13 years 11 months ago
2000
IEEE
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
IOLTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...