Concurrent programming is becoming more important due to the growing dominance of multi-core processors and the prevalence of graphical user interfaces (GUIs). To prepare students...
Concurrency is inherent in today’s software. Unexpected interactions between concurrently executing threads often cause subtle bugs in concurrent programs. Such bugs are hard to...
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
We propose a framework for policy generation in continuoustime stochastic domains with concurrent actions and events of uncertain duration. We make no assumptions regarding the co...
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...