4299 search results - page 34 / 860 » Concurrent Test Generation |
SIGCSE
2010
ACM
14 years 3 months ago
2010
ACM
Concurrent programming is becoming more important due to the growing dominance of multi-core processors and the prevalence of graphical user interfaces (GUIs). To prepare students...
ICSE
2010
IEEE-ACM
14 years 14 days ago
2010
IEEE-ACM
Concurrency is inherent in today’s software. Unexpected interactions between concurrently executing threads often cause subtle bugs in concurrent programs. Such bugs are hard to...
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
AIPS
2003
13 years 10 months ago
2003
We propose a framework for policy generation in continuoustime stochastic domains with concurrent actions and events of uncertain duration. We make no assumptions regarding the co...
EURODAC
1995
IEEE
14 years 1 days ago
1995
IEEE
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...