4299 search results - page 54 / 860 » Concurrent Test Generation |
106
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DAC
2001
ACM
16 years 3 months ago
2001
ACM
This paper describes the first application of the Genevieve test generation methodology. The Genevieve approach uses semi-formal techniques derived from "model-checking"...
DATE
2007
IEEE
15 years 8 months ago
2007
IEEE
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
116
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KBSE
1998
IEEE
15 years 6 months ago
1998
IEEE
Structural testing criteria are mandated in many software development standards and guidelines. The process of generating test-data to achieve 100 coverage of a given structural c...
125
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DATE
2004
IEEE
15 years 6 months ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
143
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ISQED
2002
IEEE
15 years 7 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...