4299 search results - page 57 / 860 » Concurrent Test Generation |
154
Voted
AOSE
2008
Springer
15 years 4 months ago
2008
Springer
Abstract. Software agents are a promising technology for today's complex, distributed systems. Methodologies and techniques that address testing and reliability of multi agent...
128
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DATE
1999
IEEE
15 years 6 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
114
Voted
ITC
1999
IEEE
15 years 6 months ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
121
Voted
GLVLSI
2008
IEEE
15 years 9 months ago
2008
IEEE
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
DATE
2003
IEEE
15 years 7 months ago
2003
IEEE
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...