4299 search results - page 60 / 860 » Concurrent Test Generation |
117
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COMPSAC
2005
IEEE
15 years 8 months ago
2005
IEEE
Automatic test data generation leads to the identification of input values on which a selected path or a selected branch is executed within a program (path-oriented vs goalorient...
110
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ICCAD
1998
IEEE
15 years 6 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
100
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DATE
2006
IEEE
15 years 8 months ago
2006
IEEE
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...
135
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EVOW
2008
Springer
15 years 4 months ago
2008
Springer
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
130
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DAC
2003
ACM
15 years 7 months ago
2003
ACM
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...