4299 search results - page 84 / 860 » Concurrent Test Generation |
162
Voted
VLSID
2010
IEEE
15 years 12 days ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
101
Voted
DATE
2009
IEEE
15 years 9 months ago
2009
IEEE
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compat...
107
Voted
DATE
1998
IEEE
15 years 6 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
114
click to vote
FATES
2004
Springer
15 years 6 months ago
2004
Springer
Abstract. Classical state-oriented testing approaches are based on simple machine models such as Labelled Transition Systems (LTSs), in which data is represented by concrete values...
144
Voted
CP
2009
Springer
15 years 5 months ago
2009
Springer
Abstract. This paper considers the automatic generation of architectural tests (ATGP), a fundamental problem in processor validation. ATGPs are complex conditional constraint satis...