49 search results - page 6 / 10 » Considering process variations during system-level power ana... |
ISLPED
2005
ACM
14 years 1 months ago
2005
ACM
Leakage power is one of the most critical issues for ultra-deep submicron technology. Subthreshold leakage depends exponentially on linewidth, and consequently variation in linewi...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
VLSID
2010
IEEE
13 years 11 months ago
2010
IEEE
A novel design approach for simultaneous power and stability (static noise margin, SNM) optimization of nanoCMOS static random access memory (SRAM) is presented. A 45nm single-end...
IROS
2008
IEEE
14 years 1 months ago
2008
IEEE
—This paper discusses human weight perception using a haptic device. The objective of this study is to reveal the characteristics in human force sensations, which are difficult t...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...