1944 search results - page 24 / 389 » Coupling-based Integration Testing |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.
IJON
2010
13 years 4 months ago
2010
Several solutions have been proposed to exploit the availability of heterogeneous sources of biomolecular data for gene function prediction, but few attention has been dedicated t...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
In this paper, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize and monitor both inter-die and spatially-correlated intra-die va...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...