70 search results - page 11 / 14 » Coverage metrics for requirements-based testing |
DFT
1997
IEEE
14 years 23 days ago
1997
IEEE
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
DATE
2002
IEEE
14 years 1 months ago
2002
IEEE
In this paper, we present an innovative methodology to estimate and improve the quality of analog and mixed-signal circuit testing. We first detect and reduce the redundancy in th...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
DATE
2004
IEEE
14 years 9 days ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...