To ensure the production of reliable circuits and fully testable unpackaged dies for MCMs burn-in, both dynamic and monitored, remains a feasible option. During this burn-in proce...
Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Jan...
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI ...
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...