Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
This paper addresses the problem of video anomaly recovery from a sequence of spectrally compressed video frames. Analysis of anomalies occurring in both time and spectrum is impo...
In this paper we introduce a new and simple algorithm to compress isosurface data. This is the data extracted by isosurface algorithms from scalar functions defined on volume gri...
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...