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DATE
2009
IEEE
88views Hardware» more  DATE 2009»
13 years 11 months ago
A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
Xiao Liu, Qiang Xu
ICCAD
2008
IEEE
103views Hardware» more  ICCAD 2008»
14 years 4 months ago
On capture power-aware test data compression for scan-based testing
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, ...
ICASSP
2011
IEEE
12 years 11 months ago
Video anomaly recovery from compressed spectral imaging
This paper addresses the problem of video anomaly recovery from a sequence of spectrally compressed video frames. Analysis of anomalies occurring in both time and spectrum is impo...
Ana B. Ramirez, Henry Arguello, Gonzalo R. Arce
VISUALIZATION
2002
IEEE
14 years 14 days ago
BLIC: Bi-Level Isosurface Compression
In this paper we introduce a new and simple algorithm to compress isosurface data. This is the data extracted by isosurface algorithms from scalar functions defined on volume gri...
Gabriel Taubin
ATS
2003
IEEE
76views Hardware» more  ATS 2003»
14 years 26 days ago
STAGE: A Decoding Engine Suitable for Multi-Compressed Test Data
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...
Bernd Koenemann