1368 search results - page 5 / 274 » Data Engineering for the Analysis of Semiconductor Manufactu... |
WSC
2008
13 years 9 months ago
2008
Cluster tools play an important role in modern semiconductor fabs. Due to their complexity in configuration and their varying material flow, the creation of accurate throughput mo...
ATS
2010
IEEE
13 years 4 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
VLSID
2004
IEEE
14 years 8 months ago
2004
IEEE
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. C...
IOLTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
WSC
2000
13 years 8 months ago
2000
The proposed implementation is a monitor system able to train operators for on-line real time manufacturing control in order to analyze the performance of a production process. Th...