105 search results - page 16 / 21 » Data on Retention |
JDCTA
2010
13 years 4 months ago
2010
The approach for predictive analysis focuses on a business strategy to streamline business-customer relationships in order to maximize client satisfaction and thereby improve cust...
VLSID
2004
IEEE
14 years 10 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
ICCAD
2008
IEEE
14 years 6 months ago
2008
IEEE
— With process variation becoming a growing concern in deep submicron technologies, the ability to efficiently obtain an accurate estimate of failure probability of SRAM compone...
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
This paper proposes a diagnosis scheme aimed at reducing diagnosis time of distributed small embedded SRAMs (e-SRAMs). This scheme improves the one proposed in [7, 8]. The improve...
ISQED
2010
IEEE
13 years 8 months ago
2010
IEEE
Reduced device dimensions and operating voltages that accompany technology scaling have led to increased design challenges with each successive technology node. Large scale 6T SRA...