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121
Voted
DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
129
Voted
DATE
2003
IEEE
15 years 9 months ago
2003
IEEE
The performance of a system, especially a multiprocessor system, heavily depends upon the efficiency of its bus architecture. This paper presents a methodology to generate a custo...
155
Voted
DATE
2010
IEEE
15 years 8 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
142
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DATE
2009
IEEE
15 years 7 months ago
2009
IEEE
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
131
Voted
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
In modern digital ICs, the increasing demand for performance and throughput requires operating frequencies of hundreds of megahertz, and in several cases exceeding the gigahertz r...