1581 search results - page 67 / 317 » Date Warehouse Design |
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
This paper presents a new multiprocessor platform for high throughput turbo decoding. The proposed platform is based on a new configurable ASIP combined with an efficient memory a...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
In this paper, we present a SoC design methodology joining the capabilities of UML and SystemC to operate at systemlevel. We present a UML 2.0 profile of the SystemC language expl...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
Side channel attacks are a major security concern for smart cards and other embedded devices. They analyze the variations on the power consumption to find the secret key of the en...
DATE
2002
IEEE
14 years 1 months ago
2002
IEEE
A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault simulation, the proposed approach calculates indirectly from the simulator output the set...