48 search results - page 7 / 10 » Defect tolerance for nanocomputer architecture |
ICRA
2005
IEEE
14 years 1 months ago
2005
IEEE
— Many tasks examined for robotic application like rescue missions or humanitarian demining require a robotic vehicle to navigate in unstructured natural terrain. This paper intr...
MICRO
2010
IEEE
13 years 5 months ago
2010
IEEE
Single-thread performance, reliability and power efficiency are critical design challenges of future multicore systems. Although point solutions have been proposed to address thes...
ASPLOS
2006
ACM
14 years 1 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
CHES
2006
Springer
13 years 11 months ago
2006
Springer
This paper describes the implementation of the Advanced Encryption Standard Algorithm, Rijndael, in a new nanoscale technology, called CMOL. This technology consists of an array of...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
Mounting concerns over variability, defects and noise motivate a new approach for integrated circuits: the design of stochastic logic, that is to say, digital circuitry that opera...