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DAC
2007
ACM
14 years 10 months ago
Fast Second-Order Statistical Static Timing Analysis Using Parameter Dimension Reduction
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
Zhuo Feng, Peng Li, Yaping Zhan
DAC
2009
ACM
14 years 10 months ago
SRAM parametric failure analysis
With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical ...
Jian Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileg...
DAC
2002
ACM
14 years 10 months ago
Hole analysis for functional coverage data
One of the main goals of coverage tools is to provide the user with informative presentation of coverage information. Specifically, information on large, cohesive sets of uncovere...
Oded Lachish, Eitan Marcus, Shmuel Ur, Avi Ziv
DAC
2003
ACM
14 years 10 months ago
Temporofunctional crosstalk noise analysis
Noise affects circuit operation by increasing gate delays and causing latches to capture incorrect values. This paper proposes a method of characterizing correlation of signal tra...
Donald Chai, Alex Kondratyev, Yajun Ran, Kenneth H...
DAC
2006
ACM
14 years 10 months ago
Statistical logic cell delay analysis using a current-based model
A statistical model for the purpose of logic cell timing analysis in the presence of process variations is presented. A new current-based cell delay model is utilized, which can a...
Hanif Fatemi, Shahin Nazarian, Massoud Pedram