231 search results - page 16 / 47 » Design issues for dynamic voltage scaling |
HPCA
2011
IEEE
12 years 11 months ago
2011
IEEE
Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely us...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Functional unit shutdown based on MTCMOS devices is effective for leakage reduction in aggressively scaled technologies. However, the applicability of MTCMOS-based shutdown in a s...
RTSS
2007
IEEE
14 years 1 months ago
2007
IEEE
Recent technological advances have opened up several distributed real-time applications involving battery-driven embedded devices with local processing and wireless communication ...
VTS
2005
IEEE
14 years 29 days ago
2005
IEEE
Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
Multi-core processors have become an integral part of mainstream high performance computer systems. In parallel, exponentially increasing power density and packaging costs have ne...