37 search results - page 4 / 8 » Design of a Robust 8-Bit Microprocessor to Soft Errors |
DATE
2010
IEEE
14 years 17 days ago
2010
IEEE
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...
ISCA
2012
IEEE
11 years 10 months ago
2012
IEEE
Soft error reliability has become a first-order design criterion for modern microprocessors. Architectural Vulnerability Factor (AVF) modeling is often used to capture the probab...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
ASAP
2008
IEEE
14 years 1 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...